Analysis of residual stress in diamond films by x-ray diffraction and micro-Raman spectroscopy
نویسندگان
چکیده
منابع مشابه
Laser Micro-Raman Spectroscopy of CVD Nanocrystalline Diamond Thin Film
Laser micro-Raman spectroscopy is an ideal tool for assessment and characterization of various types of carbon-based materials. Due to its special optical properties (CrN) coated stainless steel substrates. NCD films have been investigated by laser micro-Raman spectroscopy. The fingerprint of diamond based materials is in the spectral region of 1000-1600 cm-1 in the first order of Raman scatter...
متن کاملChemical analysis of graphene oxide films after heat and chemical treatments by X-ray photoelectron and Micro-Raman spectroscopy
Several nanometer-thick graphene oxide films deposited on silicon nitride-on silicon substrates were exposed to nine different heat treatments (three in Argon, three in Argon and Hydrogen, and three in ultra-high vacuum), and also a film was held at 70 C while being exposed to a vapor from hydrazine monohydrate. The films were characterized with atomic force microscopy to obtain local thickness...
متن کاملSurface Hardness Measurment and Microstructural Characterisation of Steel by X-Ray Diffraction Profile Analysis
An X-ray diffraction line will broaden considerably when steels change into martensitic structure on quenching. The results presented in this paper show that X-ray diffraction technique can be employed for a rapid and nondestructive measurement of hardness of hardened steel. Measurement on various quenched and tempered steels showed that the breadth of its diffraction peak increased with increa...
متن کاملStereochemistry determination by powder X-ray diffraction analysis and NMR spectroscopy residual dipolar couplings.
Traditional techniques for stereochemistry analysis have limitations; for example solution NMR spectroscopy has spatial limitation for the transference of stereochemical information, and suitable single crystals for X-ray analysis may not be available. Residual dipolar coupling (RDC) and powder X-ray diffraction (PXRD) are both techniques whose use is not yet widespread. We report a double-blin...
متن کاملNano-structural Characterization of Post-annealed ZnO Thin Films by X-ray Diffraction and Field Emission Scanning Electron Microscopy
ZnO thin films were deposited on Si(400) substrates by e-beam evaporation technique, and then post-annealed at different annealing temperatures (200-800°C). Dependence of the crystallographic structure, nano-strain, chemical composition and surface physical Morphology of these layers on annealing temperature were studied. The crystallographic structure of films was studied using X-Ray Diffracti...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
ژورنال
عنوان ژورنال: Journal of Applied Physics
سال: 2002
ISSN: 0021-8979,1089-7550
DOI: 10.1063/1.1431431